0.8 nm) exhibits low insertion loss of 2.32 dB (resp. The AWG router with a channel spacing of 3.2 nm (resp. ![]() Based on the comprehensive optimal design, we further design and experimentally demonstrate a new 8-channel 0.8 nm-channel-spacing silicon AWG router for dense wavelength division multiplexing (DWDM) application with 130 nm CMOS technology. A comparative study of the measurement results of the 3.2 nm-channel-spacing AWGs with three different designs is performed to evaluate the effect of each optimal technique, showing that a comprehensive optimization technique is more effective to improve the device. Low-loss and low-crosstalk 8 × 8 arrayed waveguide grating (AWG) routers based on silicon nanowire waveguides are reported. The basic functionality of the photonic integration is demonstrated. We characterize the individual multiplexer/demultiplexer as well as the integrated chip. We review the recent results of individual silicon modulator based on electric-field-induced carrier depletion in a SOI waveguide containing a reverse biased pn junction. In such an integrated chip, 8 high-speed silicon optical modulators with a 1:8 wavelength demultiplexer and an 8:1 wavelength multiplexer are fabricated on a single silicon-on-insulator (SOI) substrate. integrated circuit that is capable of transmitting data at hundreds gigabits per second. ![]() In this paper, we present design and fabrication of a silicon photonic. The photonic integration on silicon platform is particularly attractive because of the CMOS photonics and electronics process compatibility. Photonic integration is one of the important ways to realize low cost and small form factor optical transceivers for future high-speed high capacity I/O applications in computing systems. On the other hand, scanning electron microscopy and high-resolution transmission electron microscopy images confirm the thickness of the twofold-layer SRO films as 628 nm for the as-grown layer and 540 nm for the layer with heat-treatment, and the silicon nanocrystal size of 2.3 ± 0.6 nm for the films with thermal treatment. The energy peaks of the photoluminescence spectra were used to calculate the silicon nanocrystal size, obtaining thus an average size of 1.89 ± 0.32 nm for the as-grown layer, decreasing the size to 1.64 ± 0.01 nm with the thermal treatment. With UV–Vis spectroscopy results we obtained the absorbance and the absorption coefficient for the SRO films in order to calculate the optical bandgap energy (Egopt), which increased with heat-treatment. Fourier Transform Infrared Spectroscopy (FTIR) exhibits three characteristic vibrational modes of SiO2, as well as, the vibrating modes associated with the Si-H bonds, which disappear after the heat treatment. X-ray Photoelectron Spectroscopy shows changes in the excess-silicon in single-layer SRO films, with 10% in as-grown films and decreases to 5% for the heat-treated films. The thickness of the single-layer film is 324.7 nm while for the twofold-layer film it is 613.2 nm after heat-treated, both thicknesses decreased until 28.8 nm. SRO films single-layer and twofold-layer characterizations were compared considering the conditions as-grown and with thermal treatment at 1100 ☌ for 60 min in a nitrogen atmosphere. ![]() It does not store any personal data.This work is focused on making a correlation between results obtained by using spectroscopy and microscopy techniques from single and twofold-layer Silicon-Rich Oxide (SRO) films. The cookie is set by the GDPR Cookie Consent plugin and is used to store whether or not user has consented to the use of cookies. The cookie is used to store the user consent for the cookies in the category "Performance". This cookie is set by GDPR Cookie Consent plugin. The cookie is used to store the user consent for the cookies in the category "Other. The cookies is used to store the user consent for the cookies in the category "Necessary". ![]() The cookie is set by GDPR cookie consent to record the user consent for the cookies in the category "Functional". The cookie is used to store the user consent for the cookies in the category "Analytics". These cookies ensure basic functionalities and security features of the website, anonymously. Necessary cookies are absolutely essential for the website to function properly.
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